Professor Nick Ridler

FIEEE FIET FInstP

Awards and prizes

Professional Institute Fellowships 

3.  Fellow of the Institute of Physics (IOP Fellow), January 2016.  {certificate}

2.  Fellow of the Institute of Electrical and Electronics Engineers (IEEE Fellow), January 2014.  {certificate}, {plaqueand {announcement}

1.  Fellow of the Institution of Engineering and Technology (IET Fellow), May 2006. {certificate}

Prizes

2.  IEE Measurement Prize, 2005, for "Internet-enabled traceability for high precision measurements using microwave network analysers" {award} and {nomination}

1.  IEE Measurement Prize, 1995, for "Improvements to traceability for impedance measurement at radio frequency in the United Kingdom" {awardand {announcement}

Best Paper Awards

10. Best Student Paper Award, IEEE International Microwave Workshop Series on Advanced Materials and Processes (IMWS-AMP), July 2019, Germany, for "Fully 3-D Printed Tunable Microwave Subsystem"  {award} and {paper}

9.  Best Paper Award, ARMMS RF & Microwave Society conference, April 2017, for "3D printed waveguides: A revolution in low volume manufacturing for the 21st century".  {paper}   

8.  Best Paper Award, 83rd ARFTG conference, June 2014, USA, for "Further investigations into connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz"  {award} and {paper}

7.  Best Paper Award, 82nd ARFTG conference, November 2013, USA, for "Investigating Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz"  {award} and {paper}

6.  Best Paper Award, 74th ARFTG conference, December 2009, USA, for " Verifying transmission phase measurements at millimeter wavelengths using beadless air lines" {awardand {paper}

5.  Best Paper Award, 64th ARFTG conference, December 2004, USA, for "A generalised approach to the propagation of uncertainty in complex S-parameter measurements" {awardand {paper}

4.  Best Paper Award, 62nd ARFTG conference, December 2003, USA, for "Over-determined calibration schemes for RF network analysers employing generalised distance regression" {award} and {paper}

3.  Best Paper Award, 56th ARFTG conference, December 2000, USA, for "Evaluating and expressing uncertainty in complex S-parameter measurements" {award} and {paper}

2.  Best Paper Award, NCSL Workshop and Symposium 2000, Canada, for "Internet-based calibrations of electrical quantities at the UK's National Physical Laboratory" {award} and {paper} 

1.  Best Paper Award, 23rd ARMMS Conference, September 1995, UK, for "Analysing data - by means and by no means" {paper}

Other Awards

4.   NPL Long Service Award - 20 years, 2017.  {award}

3.  ARFTG Distinguished Service Award, December 2014.  {award}

2.  ARFTG Lifetime Member Award, December 2014. {award}

1.  Metrology for World Class Manufacturing Awards, 2001, UK, winner of category 3, "Measurement for manufacturing excellence" {announcement}

Certificates of Appreciation

5.  Automatic RF Techniques Group - Certificate of Appreciation "For serving as Technical Program Chair of the 89th ARFTG Microwave Measurement Conference", Honolulu, Hawaii, USA, June 2017.  {certificate}.

4.  IEEE Microwave Theory and Techniques Society - Certificate of Recognition "For service as the Technical Program Chair of the 2017 IEEE ARFTG Microwave Measurement Conference", Honolulu, Hawaii, USA, June 2017.  {certificate}

3.  IEEE Microwave Theory and Techniques Society - Certificate of Recognition "For service as the Technical Program Chair of the 2015 IEEE ARFTG Microwave Measurement Symposium", Phoenix, AZ, USA, May 2015.  {certificate}

2.  IEEE Microwave Theory & Techniques Society - Certificate of Recognition for "Contributions made as General Chair of the IEEE 71st ARFTG Microwave Measurement Conference", Atlanta, GA, USA, June 2008.  {certificate}

1.  The Automatic RF Techniques Group - Certificate of Appreciation "For having served as Technical Program Chair of the 65th ARFTG Conference", Long Beach, CA, USA, June 2005.  {certificate}